Automatic optical inspection system and method
US7295696B2 · kind B2 · utility
2Cited by
9References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2007 |
| Grant date | Nov 13, 2007 |
| Priority date | — |
| Expiry date | Feb 27, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/0004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.