Patent · US Expired

Measuring system and method for the functional monitoring thereof

US7295946B2 · kind B2 · utility

0Cited by

4References

8Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Hermann Hofbauer · Trostberg, DE
Erich Strasser · Trostberg, DE

Key dates

Filing date	Sep 4, 2003
Grant date	Nov 13, 2007
Priority date	—
Expiry date	Sep 4, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01D18/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring system includes a measuring device, another device and a device configured to transmit data enabling bits of data to be transmitted between the measuring device and the other device. The measuring device also includes a signal monitoring circuit and a switch element. The switch element is electrically contacted to a test potential source. The test potential source is in contact with the signal monitoring circuit according to a switch element state. The signal monitoring circuit is also in contact with the device for transmitting date. A method provides for functional monitoring of such a measuring system in a monitoring mode when a test potential is applied.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.