Systems and methods for measuring magnetostriction in magnetoresistive elements
US7298139B2 · kind B2 · utility
2Cited by
4References
25Claims
0Family size
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Key dates
| Filing date | Oct 17, 2003 |
| Grant date | Nov 20, 2007 |
| Priority date | — |
| Expiry date | Jan 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for directly measuring a magnetostriction value of a magnetoresistive element includes a fixture for receiving a substrate carrying one or more magnetoresistive elements. A magnet assembly applies a first magnetic field parallel to the substrate, and a magnetic alternating field perpendicular to the substrate and parallel to magnetoresistive layers of the elements. A stress-inducing mechanism applies a mechanical stress to the substrate, the stress being oriented parallel to the substrate. A measuring subsystem measures a signal from at least one of the magnetoresistive elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.