Patent · US Expired

Testing measurements

US7299453B2 · kind B2 · utility

6Cited by
48References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2002
Grant dateNov 20, 2007
Priority date
Expiry dateOct 20, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3684
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the invention include a testing measurement which output a non-binary test result for one or more steps or processes performed during execution of a test of a subject. The non-binary test result, which may be output by a verification point or a test script, provides a developer with an improved gauge of the subject under test. In embodiments of the present invention, a test script or verification point will, rather than simply generate a “pass” or “fail” (i.e., “successful” or “unsuccessful”) output, generate a non-boolean value providing data with improved correlation between the test output and the relative success of a test script. In some embodiments, each verification point or test script can be associated with a rule for determining the test output which can be easily modified. This aspect provides users with an ability to carefully develop and implement a test result rule which provides output which enhances test output data analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.