Patent · US Expired

Method to assess organoclay exfoliation and orientation in organoclay/polymer composites

US7300799B2 · kind B2 · utility

0Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 2005
Grant dateNov 27, 2007
Priority date
Expiry dateApr 1, 2026

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/25
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for determining degree of organoclay delamination and degree of layer alignment in a polymer organoclay nanocomposite comprising one or more infrared light spectral measurements selected from the group consisting of (A) Si—O absorption bandwidth, (B) Si—O absorption band intensity, (C) Si—O absorption band area, and (D) Si—O absorption anisotropy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.