Daughter ion spectra with time-of-flight mass spectrometers
US7301145B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 16, 2005 |
| Grant date | Nov 27, 2007 |
| Priority date | — |
| Expiry date | Jan 14, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4215
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention relates to methods and devices for measuring daughter ion spectra (also called fragment ion spectra or MS/MS spectra) in time-of-flight mass spectrometers with orthogonal injection of the ions. The invention filters the parent ions selected to be fragmented by a mass filter before they are injected into the time-of-flight mass spectrometer, fragments the selected ions in a first stage of the time-of-flight mass spectrometer within a collision cell filled with collision gas at collision energies between one and five kiloelectron-volts, further accelerates the fragment ions and measures the fragment ions in a second stage of the time-of-flight mass spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.