Three-dimensional field for calibration and method of photographing the same
US7301560B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 2004 |
| Grant date | Nov 27, 2007 |
| Priority date | — |
| Expiry date | May 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional field for calibration having a wide-angle area 110 and a zooming area 120 located within an area overlapped with the wide-angle area 110 comprises: a plurality of rough alignment reference marks 122 for zooming and a plurality of precise alignment reference marks 124 for zooming, and the rough alignment reference marks 122 and the precise alignment reference marks 124 for zooming being arranged within the zooming area 120; and a plurality of rough alignment reference marks 112 for wide-angle and a plurality of precise alignment reference marks 114 for wide-angle, the rough alignment reference marks 112 and the precise alignment reference 124 marks for wide-angle being arranged within the wide-angle area 110.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.