Method for estimating the remaining life span of an X-ray radiator
US7302041B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2004 |
| Grant date | Nov 27, 2007 |
| Priority date | — |
| Expiry date | Mar 23, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for estimating the remaining life span of an X-ray radiator that has been installed in an X-ray apparatus and is operational, under specified test conditions and at time intervals, a measurement value that is indicative for the remaining life span of the X-ray radiator is determined and stored in a memory. A forecasted progression of future measurement values is then forecasted from the instantaneous measurement value and previous measurement values that were determined under identical test conditions, which also are stored in the memory. The forecasted remaining life span of the X-ray radiator is then determined based on the forecasted progression and a limit value that is associated with the individual X-ray radiator, which is stored in the memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.