Method and system for quantifying and removing spatial-intensity trends in microarray data
US7302348B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2004 |
| Grant date | Nov 27, 2007 |
| Priority date | — |
| Expiry date | Sep 7, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16B25/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for quantifying and correcting spatial-intensity trends for each channel of a microarray data set having one or more channels. The method and system of one embodiment of the present invention selects a set of features from each channel of the microarray data set. Based on the selected set of features, a surface is used to determine the intensities for all features in each channel of the microarray data set. Spatial-intensity trends within the microarray data set are quantified, based on the surface to the intensities for each channel of the microarray data set. After the surface has been determined, the spatial-intensity trend can be removed from the microarray data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.