Leakage control in integrated circuits
US7302652B2 · kind B2 · utility
5Cited by
4References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2003 |
| Grant date | Nov 27, 2007 |
| Priority date | — |
| Expiry date | Oct 7, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Although there are a number of techniques available to reduce leakage current, there is still considerable room for improvement. Accordingly, the present inventors devised, among other things, an exemplary method which entails defining first and second leakage-reduction vectors for respective first and second portions of an integrated circuit, such as a microprocessor. The leakage-reduction vectors, in some embodiments, set the first and second portion to minimum leakage states and thus promise to reduce leakage power and extend battery life in devices that incorporate this technology.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.