Characterization of the nonlinearities of a display device by adaptive bisection with continuous user refinement
US7304482B1 · kind B1 · utility
5Cited by
4References
17Claims
0Family size
Inventors
Key dates
| Filing date | Dec 4, 2003 |
| Grant date | Dec 4, 2007 |
| Priority date | — |
| Expiry date | Feb 11, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/0673
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring and characterizing the nonlinearities of a display device by adaptive bisection using human perception for measurement. This method makes no assumptions about a display device's characteristics and can characterize any type of display device with any arbitrarily complex monotonic display transfer function. Unlike other display measurement solutions, this process is completely software based and has no hardware measurement device requirements that would raise costs and limit portability. As a result, this process can be distributed and applied commercially at a very low cost.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.