Sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor in a sub-sampling mode
US7304674B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2002 |
| Grant date | Dec 4, 2007 |
| Priority date | — |
| Expiry date | Nov 8, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/00
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor. The APS image sensor supports a normal mode of operation and a sub-sampling mode of operation. The method includes providing a plurality of column amplifiers. A row of pixels circuits to sample is selected. Image signals from each pixel circuit in the selected row are routed to a different one of the plurality of column amplifiers when the APS image sensor is in the normal mode of operation. Image signals from a plurality of the pixel circuits in the selected row are routed to one of the plurality of column amplifiers when the APS image sensor is in the sub-sampling mode of operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.