Patent · US Expired

Throttling memory in response to an internal temperature of a memory device

US7304905B2 · kind B2 · utility

24Cited by
5References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 2004
Grant dateDec 4, 2007
Priority date
Expiry dateAug 17, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02D10/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Systems and methods of managing memory devices provide for reduced power consumption and better thermal management through enhanced memory throttling. In one embodiment a memory unit includes a memory device and a temperature measurement module coupled to the memory device. The temperature measurement device measures the internal temperature of the memory device. Memory throttling can therefore be implemented based on more accurate measurements and with a much shorter response time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.