Method, system, and product for isolating memory system defects to a particular memory system component
US7305595B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2003 |
| Grant date | Dec 4, 2007 |
| Priority date | — |
| Expiry date | Jan 27, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system, and product are disclosed for isolating a defect in a memory system by determining in which particular component of the memory system the defect exists. The memory system includes multiple components. The components include a physical memory module, a memory card to which the physical memory module is attached, and a memory controller for controlling the memory card. The memory card includes one or more electrical buffers for driving or detecting the memory signals. The buffers may be used as virtual memory elements. Each component is tested separately in order to identify the defective component with the help of virtual memory system elements. The components are tested by first testing the physical memory module. If the physical memory module passes the test, the memory card is then tested. If the memory card passes its test, the memory controller is tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.