Patent · US Expired

Methods for detecting chromosome aberrations

US7306916B2 · kind B2 · utility

3Cited by
20References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 3, 2005
Grant dateDec 11, 2007
Priority date
Expiry dateOct 15, 2025

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC12Q2600/156
  • WIPO fieldBiotechnology
  • WIPO sectorChemistry

Abstract

The present invention relates to methods for detecting a change in chromosomal structure. These methods employ labeled probes that bind nucleic acids. For example, these probes may be comprised of nucleic acids or nucleic acid analogs and a detectable label.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.