Patent · US Expired

Method and device for functionally testing an analog to-digital converter and a corresponding analog-to-digital converter

US7307561B2 · kind B2 · utility

3Cited by
10References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 2003
Grant dateDec 11, 2007
Priority date
Expiry dateFeb 15, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/18
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method and device for function testing an analog-digital converter, the analog-digital converter performing a function for converting at least one analog signal into at least one digital signal using a first predetermined reference voltage, wherein the analog-digital converter is able to perform the function alternatively using at least one other reference voltage, in particular a predetermined second reference voltage, the analog-digital converter being blocked to prevent use of at least the other reference voltage, in particular the second reference voltage, by the analog-digital converter, a predetermined analog signal being converted into a digital signal for the function test and the digital signal being analyzed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.