Computer platform automatic testing method and system
US7308376B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2005 |
| Grant date | Dec 11, 2007 |
| Priority date | — |
| Expiry date | Feb 9, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer platform automatic testing method and system is proposed, which is designed for use in conjunction with a computer platform for performing an automatic testing procedure on a computer-dedicated circuit unit installed on the computer platform, and which is characterized by the capability of performing an automatic testing procedure on a computer-dedicated circuit unit based on a user-specified set of hardware specification data about the computer platform and circuit unit under test, and the capability of automatically generating a test report that lists related data about each faulted part of the circuit unit being tested. This feature allows hardware engineers to more conveniently and efficiently correct faulted parts in the circuit unit being tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.