Patent · US Expired

Apparatus and method for calibration of a temperature sensor

US7309157B1 · kind B1 · utility

19Cited by
24References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 2004
Grant dateDec 18, 2007
Priority date
Expiry dateFeb 27, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K15/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit for temperature sensing provides a bias current to a PN junction, and the PN junction provides a PN junction voltage in response to the bias current. Also, a parasitic resistance may be coupled in series with the PN junction. The circuit for temperature sensing is configured to determine the temperature of the PN junction based on the PN junction voltage. Further, the circuit includes registers which store ηtrim, which is based on the difference between the non-ideality of the PN junction used from a reference PN junction; ΔI, which is based on the difference between a reference bias current and the bias current for the part; Rtrim, which is based the parasitic resistance; and Ntrim, which includes other offsets. The registers may be set during trimming and/or calibration to provide accurate temperature sensing for the parameters employed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.