Method and apparatus for measuring prism characteristics
US7310136B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2005 |
| Grant date | Dec 18, 2007 |
| Priority date | — |
| Expiry date | Jun 6, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0235
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is a method comprising illuminating a microstructured prism, or linear array of prisms of a prism sheet with an incident beam. The method further comprises making measurements of the refracted image of the beam on a measuring device to measure the distance disposed on an opposing side of the prism sheet from the side that the light beam is incident upon. Measurement of two angles of the refracted images of the beam on the ruled scale, measured twice, illuminating the sample at different angles are used in an equation to simultaneously provide the apex angle, the skew angle and the refractive index of the prism sheet.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.