Patent · US Expired

Apparatus and method for determining optical retardation and birefringence

US7310145B2 · kind B2 · utility

2Cited by
6References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 23, 2004
Grant dateDec 18, 2007
Priority date
Expiry dateFeb 13, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/23
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for determining the optical retardation and birefringence values of an anisotropic material utilizing a Fourier transform near infrared spectrophotometer operated in at least a portion of the range of wavenumbers between about 4,000 to about 10,000 cm−1.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.