Method and apparatus for scanning regions
US7310174B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2005 |
| Grant date | Dec 18, 2007 |
| Priority date | — |
| Expiry date | Nov 28, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/085
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A beam scanner is operable to scan light in two or more axes, typically in a raster pattern that includes a fast scan axis and a slow scan axis. Plural beams of light are scanned, each beam of light producing a scanned region that at least partially overlaps at least one adjoining scanned region. Scanned regions may be aligned to adjoin and overlap along a dimension corresponding to the slow scan axis. The beam scanner may comprise a scanned beam display and/or a scanned beam image capture device. In a display, the power level of overlapping displayed pixels may be scaled to provide smooth transitions between adjoining regions to improve the image quality presented to a viewer. In an image capture device, one or more detectors is operable to collect light scattered from adjoining regions and a controller is operable to produce an image from the scanned regions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.