Optical methods for remotely measuring objects
US7310431B2 · kind B2 · utility
352Cited by
11References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 10, 2003 |
| Grant date | Dec 18, 2007 |
| Priority date | — |
| Expiry date | Dec 6, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A class of measurement devices can be made available using a family of projection patterns and image processing and computer vision algorithms. The proposed system involves a camera system, one or more structured light source, or a special pattern that is already drawn on the object under measurement. The camera system uses computer vision and image processing techniques to measure the real length of the projected pattern. The method can be extended to measure the volumes of boxes, or angles on planar surfaces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.