Patent · US Expired

Recognition device and method

US7310446B2 · kind B2 · utility

9Cited by
10References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2003
Grant dateDec 18, 2007
Priority date
Expiry dateJan 1, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/754
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A recognition device which judges whether a target is identical with a predetermined reference, comprising: a holding unit which holds the target; multiple deformation units which deform the target held by the holding unit with at least one degree of flexibility in deformation; multiple deformed amount estimation units which correspond to the deformation units in a one-to-one relationship and estimate a deformed amount of the target from the reference with respect to the flexibility in deformation according to the corresponding deformation unit; an estimated error evaluation unit which evaluates an estimated error of the deformed amount estimated by the deformed amount estimation unit; an adjustment unit which operates any of the deformation units with precedence according to the estimated error evaluated by the estimated error evaluation unit; a similarity calculation unit which calculates a similarity between the reference and the target which is deformed by the deformation unit operated with precedence by the adjustment unit; and a judgment unit which judges whether the target is identical with the reference according to the similarity calculated by the similarity calculation un…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.