Method for enabling comprehensive profiling of garbage-collected memory systems
US7310718B1 · kind B1 · utility
7Cited by
5References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 24, 1999 |
| Grant date | Dec 18, 2007 |
| Priority date | — |
| Expiry date | Nov 24, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3466
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for profiling a heap. According to the method, a flexible and comprehensive general-purpose profiling interface that uniformly accommodates a wide variety of memory allocation and garbage collection methods is used. The profiling interface, among other things, employs a set of virtual machine profiling interface events that support all known types of garbage collection methods.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.