Probe attach tool
US7311239B2 · kind B2 · utility
4Cited by
14References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2004 |
| Grant date | Dec 25, 2007 |
| Priority date | — |
| Expiry date | Jan 17, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A tool for attaching fine preformed probes to a substrate for use with a vacuum source is disclosed. The apparatus comprises a body portion; a tip portion disposed at one end of the body portion; a first orifice extending from a first end of the body portion to the working tip; and at least one second orifice extending from an outer portion of the working tip and communicating with the first orifice, wherein the vacuum source is coupled to the body portion so that a vacuum generated by the vacuum source is provided to the at least one second orifice.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.