Out-of-plane birefringence measurement
US7312869B2 · kind B2 · utility
2Cited by
1References
30Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 16, 2005 |
| Grant date | Dec 25, 2007 |
| Priority date | — |
| Expiry date | Jun 22, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/23
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure is directed to precise measurement of out-of-plane birefringence properties of samples of transparent optical material. Two angled-apart light beams are passed through a selected location of a sample optical element. One of the beams is incident to the sample surface. The characteristics of the beams are detected after passing through the sample, and the information detected is processed to determine the out-of-plane birefringence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.