System, and method for quantifying voltage anomalies
US7315790B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 22, 2005 |
| Grant date | Jan 1, 2008 |
| Priority date | — |
| Expiry date | Nov 22, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/2513
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method of quantifying voltage anomalies may be used to quantify low frequency voltage transients such as the type caused by power factor correction (PFC) or similar events. The system and method of quantifying voltage anomalies receives sampled voltage data values and computes ideal sine wave data values. The system and method of quantifying voltage anomalies may also compute difference data values representing a difference between the received voltage data and the ideal sine wave and may compute score data values such as non-linear score values representing the difference data values relative to a peak voltage value or RMS voltage value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.