Patent · US Expired

Organization of test cases

US7316004B2 · kind B2 · utility

11Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2002
Grant dateJan 1, 2008
Priority date
Expiry dateSep 3, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3684
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the invention include a test case that is encapsulated defining its relationship with other such encapsulated test cases. An encapsulated test case may be explicitly associated with one or more parent test cases. Additionally, or alternatively, a test case embodying aspects of the present invention may be explicitly associated with one or more child test cases. Through such explicit relationships between test cases a complex hierarchical structure of test cases can be quickly and efficiently created. Further aspects of the invention, which may be incorporated in some embodiments, include an encapsulated test case which, when associated with other encapsulated test case, results in an explicit tree-like hierarchical structure of test cases being defined. In further embodiments of the present invention, a test case (encapsulated or conventional) may be associated with a test case association property. The test case association property explicitly defines the relationship between a parent test case and a child test case. That is, the test case association property defines a bi-directional (i.e., two way) association between a parent and child test case. In one embodimen…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.