Patent · US Expired

Test table for measuring lateral forces and displacements

US7316155B2 · kind B2 · utility

3Cited by
16References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 2003
Grant dateJan 8, 2008
Priority date
Expiry dateFeb 24, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0605
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test table for measuring lateral forces and displacements while simultaneously applying, if necessary, normal forces, particularly in nanoidenters and in scratch and wear testers. The test table is mounted in a manner that enables it to be laterally displaced, and the lateral force and displacement can be determined by means of a measured-value acquisition. The test table is fixed between at least two vertically upright leaf springs, which can be laterally deflected in the direction of the lateral (horizontal) motion of the test table to be effected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.