Patent · US Expired

Method for manufacturing a solid-state image sensing device, such as a CCD

US7316937B2 · kind B2 · utility

7Cited by
12References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2004
Grant dateJan 8, 2008
Priority date
Expiry dateJul 29, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/811

Abstract

Light detecting elements are formed in areas marked off by scribe lines on a semiconductor substrate, and color filters are deposited in such a manner as to cover the formed areas of the light detecting elements, and then an infrared cut-off filter, on which an infrared reflecting film is vapor-deposited in such a manner as to cover the formed areas of the light detecting elements, is firmly fixed to the surface of the semiconductor substrate through the interposition of a translucent resin layer, such as an epoxy adhesive, to thereby form a multilayered structure, and this multilayered structure is diced along scribe lines.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.