Wavelength dispersive fourier transform spectrometer
US7317535B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 9, 2005 |
| Grant date | Jan 8, 2008 |
| Priority date | — |
| Expiry date | Jan 25, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/12019
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectroscopic method and system for the spectral analysis of an optical signal directed to a wavelength dispersive component having two interleaved dispersive devices. For a single wavelength, the optical signal exiting the interleaved dispersive devices includes two wavefronts generally disposed at an angle to one another and producing an interference pattern. The interference pattern is detected and subsequently analyzed via a Fourier transform to produce the optical spectrum of the input beam. The method and system are applicable in a planar waveguide environment, in reflection and transmission geometries.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.