Patent · US Expired

Wavelength dispersive fourier transform spectrometer

US7317535B2 · kind B2 · utility

8Cited by
5References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 9, 2005
Grant dateJan 8, 2008
Priority date
Expiry dateJan 25, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/12019
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A spectroscopic method and system for the spectral analysis of an optical signal directed to a wavelength dispersive component having two interleaved dispersive devices. For a single wavelength, the optical signal exiting the interleaved dispersive devices includes two wavefronts generally disposed at an angle to one another and producing an interference pattern. The interference pattern is detected and subsequently analyzed via a Fourier transform to produce the optical spectrum of the input beam. The method and system are applicable in a planar waveguide environment, in reflection and transmission geometries.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.