Skin reflectance model for representing and rendering faces
US7319467B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2005 |
| Grant date | Jan 15, 2008 |
| Priority date | — |
| Expiry date | Nov 6, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/555
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A face is scanned to obtain a three-dimensional geometry of the face, images are also acquired of the face, and subsurface scattering of the face is measured. A translucency map is determined from the subsurface reflectance. A total surface reflectance and a normal map are estimated from the three-dimensional geometry and the images, and diffuse reflectance is estimated using the total reflectance. An albedo map is determined from the diffuse reflectance. The diffuse reflectance is subtracted from the total reflectance to obtain a surface reflectance. A set of bi-directional reflectance functions is fitted to the surface reflectance. Then, the set of bi-directional reflectance distribution functions, the albedo map, and the translucency map are combined to form a skin reflectance model of the face.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.