Patent · US Expired

Self-referencing instrument and method thereof for measuring electromagnetic properties

US7321424B2 · kind B2 · utility

2Cited by
4References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 4, 2005
Grant dateJan 22, 2008
Priority date
Expiry dateAug 4, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/1281
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a self-referencing instrument for measuring electromagnetic radiation, a mounting member to which a sample can be coupled moves the sample such that, in a first position, the electromagnetic radiation impinges on the sample, and, in a second position, the electromagnetic radiation does not impinge on the sample. A detection unit receives the electromagnetic radiation from the sample and generates a sample signal when the sample is in the first position, and the detection unit receives the electromagnetic radiation from the source and generates a reference signal when the sample is in the second position. A processor coupled to the detection unit processes the reference signal and the sample signal. This results in a continuous, accurate reference measurement, and permits the instrument to efficiently compensate for error, while offering accurate measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.