Patent · US Expired

Temperature measurement device

US7322744B2 · kind B2 · utility

3Cited by
68References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2005
Grant dateJan 29, 2008
Priority date
Expiry dateDec 16, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K5/54
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A temperature measuring device includes a temperature-responsive element that mechanically moves a first inductive assembly component relative to a second inductive assembly component in response to temperature changes. The movement of the first inductive assembly component relative to the second inductive assembly component generates a change in a local eddy current pattern that corresponds to the sensed temperature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.