Method and system for spectral stitching of tunable semiconductor sources
US7324569B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2004 |
| Grant date | Jan 29, 2008 |
| Priority date | — |
| Expiry date | Mar 24, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi semiconductor source tunable spectroscopy system has two or more semiconductor sources for generating tunable optical signals that are tunable over different spectral bands. The system enables the combination of these tunable signals to form an output signal that is tunable over a combined band including these individual spectral bands of the separate semiconductor sources. The system further compensates for spectral roll-off associated with the semiconductor sources. Specifically, near the limits of the semiconductor sources' spectral bands, the power in the tunable signal tends to degrade or decrease. The system compensates for this roll-off using drive current control, attenuators, or electronic compensation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.