Sampling in a multidimensional database
US7324991B1 · kind B1 · utility
26Cited by
7References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 30, 2002 |
| Grant date | Jan 29, 2008 |
| Priority date | — |
| Expiry date | Dec 5, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99935
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Sampling may be supported in a multidimensional database by integrating it into metadata and/or data navigation requests. Additionally, biasing may be introduced to allow a user to focus results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.