Patent · US Expired

Method for depositing a group III-nitride material on a silicon substrate and device therefor

US7327036B2 · kind B2 · utility

16Cited by
5References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 2004
Grant dateFeb 5, 2008
Priority date
Expiry dateFeb 9, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/933
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention is related to a device comprising a substrate comprising a silicon substrate having a porous top layer, a second layer on said top layer, said second layer made of a material comprising Ge, and a further layer of a Group III-nitride material on the second layer. The present invention further is related to methods of production and to intermediate or template devices highly suitable for the epitaxial growth of a high quality Group III-nitride layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.