Testing apparatus and testing method using the same
US7327135B2 · kind B2 · utility
Assignees
Inventor
Key dates
| Filing date | Jun 26, 2006 |
| Grant date | Feb 5, 2008 |
| Priority date | — |
| Expiry date | Jul 18, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary testing apparatus (200) for testing electronic device (280) includes a workbench (210), a conveyance board (221) for supporting the electronic device to be tested and a testing device (270). The conveyance board is slidably positioned on the workbench. The testing apparatus further includes an automatic detection device (250), a high voltage connector (241) and an automatic controller (290). The automatic controller receives a signal sent by the automatic detection device and sends an instruction to control the operation of the high voltage connector to connect a plurality of signal channels. The testing apparatus is safe and can reduce the cost.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.