Test strip system
US7327451B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 10, 2002 |
| Grant date | Feb 5, 2008 |
| Priority date | — |
| Expiry date | Mar 5, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8483
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a test field system, including a test strip with a test field, and a measuring device having a test strip receiver for measuring the test field. The test strip receiver inducing a support surface for the test strip and positioners for holding the test strip inserted in the strip receiver so that a section of the test strip containing the test field is held in a definite position relative to the support surface. The strip receiver having two holding members spaced from one another on edge areas of the support surface for holding fast associated edges of the test strip substantially adjacent the support surface, the support surface in a middle area between the holding means is vertically displaced from the edge areas such that the test field of a test strip inserted in the test strip receiver is spaced apart from the support surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.