Patent · US Expired

Alignment method of micro-alignment members and device thereof

US7330308B2 · kind B2 · utility

0Cited by
4References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2005
Grant dateFeb 12, 2008
Priority date
Expiry dateAug 27, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/3616
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An alignment method of micro-alignment members includes a first step for moving a reticle, which is movably disposed between a first position and a second position, to face a first microscope in the first position, and for aligning a center of the reticle with an optical axis of the first microscope while observing the reticle by the first microscope, a second step for moving the reticle to the second position to face a second microscope in the second position, and for aligning the center of the reticle with an optical axis of the second microscope while observing the reticle by the second microscope, a third step for disposing a first micro-alignment member such that a center of the first micro-alignment member aligns with the optical axis of the second microscope, and a fourth step for disposing a second micro-alignment member instead of the reticle to face the first micro-alignment member.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.