Alignment system and method
US7334947B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2006 |
| Grant date | Feb 26, 2008 |
| Priority date | — |
| Expiry date | Oct 16, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/4236
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The present invention provides an alignment system comprising a base having a feature that accepts a first optical element, a first eccentric element having a through hole that accepts an eccentric assembly comprising a second eccentric element having a feature that accepts a second optical element and is attached to the second optical element via second attachment means, wherein the first eccentric element is engaged with the base via first attachment means and axial alignment between optical axis of the first optical element and optical axis of the second optical element is achieved by rotationally adjusting at least one of the eccentric elements relative to the base. The present invention also provides methods to make and use this alignment system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.