Apparatus and methods for measurement of analog voltages in an integrated circuit
US7336212B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2005 |
| Grant date | Feb 26, 2008 |
| Priority date | — |
| Expiry date | Sep 14, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/56
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to apparatus and methods for measurement of analog voltages in an integrated circuit. In particular, the apparatus includes an on-chip digital-to-analog converter configured to receive a variable digital input code and output a corresponding analog voltage corresponding to the variable digital input code. The apparatus also includes an on-chip comparator circuit configured to receive the analog voltage output by the digital-to-analog converter and a test analog voltage as inputs and to provide an output indicating the test analog voltage. Further, the apparatus includes an on-chip logic operative to determine the test analog voltage based on the output of the comparator circuit. A corresponding method is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.