Time-frequency domain reflectometry apparatus and method
US7337079B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 7, 2003 |
| Grant date | Feb 26, 2008 |
| Priority date | — |
| Expiry date | Sep 15, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/11
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for high-resolution reflectometry that operates simultaneously in both the time and frequency domains, utilizing time-frequency signal analysis and a chirp signal multiplied by a Gaussian time envelope. The Gaussian envelope provides time localization, while the chirp allows one to excite the system under test with a swept sinewave covering a frequency band of interest. High resolution in detection of the reflected signal is provided by a time-frequency cross correlation function. The high-accuracy localization of faults in a wire/cable can be achieved by measurement of time delay offset obtained from the frequency offset of the reflected signal. The apparatus enables one to execute an automated diagnostic procedure of a wire/cable under test by control of peripheral devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.