Patent · US Active

Feedback circuit for output control in a semiconductor X-ray detector

US7339175B1 · kind B1 · utility

14Cited by
0References
22Claims
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Assignee

Inventors

Key dates

Filing dateJul 28, 2006
Grant dateMar 4, 2008
Priority date
Expiry dateAug 18, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01T1/2928
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

An X-ray detector using a semiconductor detector, most preferably a Silicon Drift Detector, utilizes a field effect transistor or other voltage-controlled resistance to generate an output voltage proportional to its input charge (which is generated by the X-ray photons incident on the semiconductor detector). To keep the charge (and thus the output voltage) to an acceptable range—one wherein the relationship between output voltage and input charge is substantially proportional—a feedback circuit is provided between the output and input terminals, wherein the charge on the input terminal is depleted when the output voltage begins leaving the desired range. Preferably, this is done by a comparator which monitors the output voltage, and provides a reset signal to the input terminal when it begins moving out of range. Alternatively or additionally, the reset signal may be a pulse supplied to the input terminal from a pulse generator activated by the comparator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.