System and method for inspecting a light-management film and method of making the light-management film
US7339664B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2004 |
| Grant date | Mar 4, 2008 |
| Priority date | — |
| Expiry date | Oct 21, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8967
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects; directing transmission light from a backlight source through a second side of the light-management film to the first side and examining the light-management film for defects; reflecting light from the overhead light source off the second side of the light-management film and examining the light-management film for defects; directing transmission light from the backlight source through the first side of the light-management film to the second side and examining the light-management film for defects; and measuring a location of each of the examined defects in the light-management film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.