Patent · US Expired

Device for the analysis of the qualitative composition of gases

US7339669B2 · kind B2 · utility

3Cited by

12References

23Claims

0Family size

Assignee

Drägerwerk Aktiengesellschaft · DE

Inventors

Hans Matthiessen · Bad Schwartau, DE
Gerd Peter · Lübeck, DE
Axel Lamprecht · Wulfen, DE

Key dates

Filing date	Nov 7, 2005
Grant date	Mar 4, 2008
Priority date	—
Expiry date	Nov 30, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/3504
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for the analysis of the qualitative, optionally also the quantitative composition of gases, uses measuring light of known spectral composition that can pass through the gas to be analyzed and the gas can be caused to interact. A detector arrangement is present, which can detect light originating from the sites of the interaction between the measuring light and the gas to be analyzed. At least one refractive-diffractive optical element is provided, which is transparent over its entire surface and contributes to a wavelength-dependent imaging of the light to be detected onto the detector arrangement in a transmitting manner. The refractive-diffractive optical element is arranged in the ray path between the area in which the interaction between the gas to be analyzed and the measuring light takes place and the detector arrangement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.