Method and apparatus for jitter measurement using phase and amplitude undersampling
US7339984B1 · kind B1 · utility
12Cited by
9References
27Claims
0Family size
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Key dates
| Filing date | Sep 5, 2003 |
| Grant date | Mar 4, 2008 |
| Priority date | — |
| Expiry date | Jan 31, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L7/0334
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for measuring jitter using phase and amplitude undersampling. A sampling circuit samples an input signal to obtain amplitude and phase information, a computation circuit determines Time Interval Error (TIE) information from the amplitude and phase information, and a signal processor processes the TIE information to generate a jitter spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.