Temperature measurement circuit calibrated through shifting a conversion reference level
US7341374B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 25, 2005 |
| Grant date | Mar 11, 2008 |
| Priority date | — |
| Expiry date | Nov 4, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature measurement circuit has a current excitation circuit, a temperature calculation circuit, a calibration factor generator, and an analog-to-digital conversion circuit. The current excitation circuit supplies in sequence at least two currents to a thermal sensor. At least two output signals are correspondingly generated from the thermal sensor. In response to the at least two output signals, the temperature calculation circuit calculates an analog temperature signal representative of a temperature detected by the thermal sensor. The analog-to-digital conversion circuit converts the analog temperature signal into a digital signal based on a conversion reference level. The conversion reference level is shifted in accordance with a calibration value generated from the calibration factor generator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.