Beam-forming apparatus and method using a spatial interpolation based on regular spatial sampling

US7342535B2 · kind B2 · utility

Assignee

• SAMSUNG ELECTRONICS CO., LTD. · KR

Inventors

• Jong-Hoon Ann · Seojong-myeon, KR
• Song-Hun Kim · Suwon-si, KR
• Byoung Yun Kim · Daejeon, KR
• Hye-Young Lee · Dongjin-myeon, KR
• Hyeon-Woo Lee · Suwon-si, KR
• Achim Seebens · Duisburg, DE
• Tobias Scholand · Wiesloch, DE
• Peter Jung · Munich, DE
• Admir Burnic · Duisburg, DE
• Arjang Hessamian-Alinejad · Duisburg, DE

Key dates

• Filing date: Apr 7, 2006
• Grant date: Mar 11, 2008
• Expiry date: Apr 20, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F2218/22
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A beam-forming apparatus and method for improving system performance using a spatial interpolation and at least one Angle of Arrival (AoA) in a system based on regular spatial sampling is provided. The AoA is estimated using a carrier-to-interference ratio. Beam-forming angles are distributed and steered in a predefined scheme such that an identical process is applied in all directions. According to this steering, a linear system model is computed based on regular spatial sampling using regular spatial separation at beam angles. Beam-forming performance is improved by compensating for a difference between adaptive and sector-type arrays. Only the steps of computing a spatial interpolation and determining an angle range for beam-forming using at least one AoA are added. The precision of estimating an AoA and the precision of beam-forming increase without an additional antenna. Because the system is simpler than that of an adaptive beam-forming system, significant gain is obtained.