Patent · US Expired

System and method for metadata verification during measurement processing

US7343266B2 · kind B2 · utility

2Cited by

1References

18Claims

0Family size

Assignee

AGILENT TECHNOLOGIES, INC. · US

Inventors

Jerry Liu · Palo Alto, US
Bruce Hamilson · Menlo Park, US
Jefferson B. Burch · Palo Alto, US

Key dates

Filing date	Nov 30, 2005
Grant date	Mar 11, 2008
Priority date	—
Expiry date	Nov 30, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01D21/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system and method of verifying metadata in a measurement processing system is described. Each combination of metadata is associated with a key, and the keys are used to verify that operations performed using the measurements are valid based on the metadata of the respective measurements. Embodiments allow metadata verification to be made prior to operating on measurements. Embodiments also minimize the processing that results from making such checks redundantly causing slowdown in the measurement processing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.